### Symbiosis Entrance Test (SET- M.Tech) - Electronics and Communication Engineering Exam Pattern

#### Exam Pattern

The **SET M.Tech in Electronics and Communication Engineering **Entrance Exam follows GATE Exam pattern -

In all the papers, there will be a total of 65 questions carrying 100 marks. The exam would contain questions of two different types in various papers:

**Multiple Choice Questions (MCQ)** carrying 1 or 2 marks each in all papers and sections. These questions are objective in nature, and each will have a choice of four answers, out of which the candidate has to mark the correct answer(s).

**Numerical Answer Questions **of 1 or 2 marks each in all papers and sections. For these questions the answer is a real number, to be entered by the candidate using the virtual keypad. No choices will be shown for this type of questions.

**Test duration- ** 2 Hours

**Marking System for all branches – ** For **1-mark** multiple-choice questions, **1/3 marks **will be deducted for a wrong answer. Likewise, for **2-marks **multiple-choice questions, **2/3** marks will be deducted for a wrong answer. There is no negative marking for numerical answer type questions.

### Syllabus Summary

No. Of Subject | 9 |
---|---|

No. Of Unit | 31 |

No. Of Chapter | 119 |

- Sample and Hold Circuits
- ADCs and DACs

- Latches and flip-flops
- Finite State Machines

- Boolean Algebra
- Boolean Identities and Karnaugh map

- ROM
- SRAM
- DRAM

- Architecture
- Programming
- I/O Interfacing

- Basic Control System Component
- Block Diagram Representation
- Frequency Response
- Routh-Hurwitz and Nyquist criteria
- Lag, Lead and Lead-Lag Compensators

- Fourier series and Fourier transform representations
- Sampling Theorem and Applications
- Discrete-time Signals
- LTI systems

- Nodal and Mesh Analysis
- Network Theorems
- Wye-Delta Transformation
- Steady State Sinusoidal Analysis
- Time Domain Analysis
- Solution of Network Equations
- Frequency Domain Analysis
- Linear 2-Port Network Parameters
- State Equations for Networks

- Antenna Types
- Antenna Arrays
- Basics of Radar
- Light Propagation In Optical Fibers

- Differential and Integral Forms
- Wave Equation
- Poynting vector

- Reflection and Refraction
- Propagation through Various Media
- Transmission Line

- Modes
- Boundary Conditions
- Dispersion Relations

- Energy bands in Intrinsic and Extrinsic Silicon

- Generation and Recombination of Carriers
- Poisson and Continuity Equations
- P-N junction, Zener Diode
- Integrated Circuit Fabrication Process

- Biasing, Bias Stability
- Frequency Response
- BJT and MOSFET

- Clipping, Clamping
- Rectifiers

- Simple op-amp circuits
- Sinusoidal oscillators
- Function generators
- Voltage reference circuits
- Power supplies

- Small Signal Equivalent Circuits

- PCM, DPCM, Digital Modulation Scheme
- SNR and BER for Digital Modulation
- Hamming Codes
- Timing and frequency Synchronization
- Basics of TDMA, FDMA and CDMA

- Amplitude Modulation and Demodulation
- Spectra of AM and FM
- Circuits for Analog Communications

- Entropy, Mutual Information
- Channel Capacity Theorem

- Autocorrelation and Power Spectral Density
- Properties of White Noise
- Filtering of Random Signals

- Mean value theorem
- Chain rule
- Partial Derivatives
- Maxima and Minima
- Gradient
- Divergence and curl
- Directional derivatives
- Integration

- First order linear and nonlinear differential equations
- Higher Order Linear Odes
- Partial differential equations
- Laplace transforms
- Numerical methods for linear and nonlinear algebraic equations
- Numerical integration and differentiation

- Analytic Functions
- Cauchy's Integral Theorem
- Cauchy's Integral Formula
- Taylor's and Laurent's series
- Residue Theorem

- Vectors in Plane and space
- Vector Operations
- Gauss's, Green's and Stoke's Theorems

- Vector Space
- Linear Dependence and Independence
- Matrix Algebra
- Eigenvalues and Eigenvectors
- Solution of Linear Equations

- Sampling theorems
- Conditional probability
- Mean, Median, Mode
- Poisson distribution
- Binomial distribution
- Regression analysis

- Solution of nonlinear equations
- Methods for Differential Equations
- Convergence Criteria

- Numerical computation
- Numerical Estimation
- Numerical Reasoning
- Data Interpretation

- English grammar
- Sentence Completion
- Verbal Analogies
- Word Groups
- Instructions
- Critical Reasoning
- Verbal Deduction

#### How to prepare

?**Preparation Strategy**

**Make a proper Time Table**

It is very important that you **make a time table and stick to it** and you will have an exact idea of what you are required to study and the time required for it.

**Concept clarity rather than rote learning**

It is essential that you have a clear idea of the **formulas and concepts** rather than rote learning of things for the papers. While you might require it for memorizing formulas it is important that for other stuff you make sure you **clear your basis and concepts** before moving on.

**Prepare Notes**

It is very important **make small notes** or a **comprehensive list of formulas on **each covered topic and chapter which will come in handy at the time of revision. This will require you to be regular with your work but will surely make things easy at the time of revision.

**Duration :**120 Minutes

#### Important Instructions

Bring the following documents while reporting to the Test Centre: Admit Card Your latest colored passport size photograph should be pasted on the Admit Card at the place provided for Photo identity as specified in the Admit Card page Blue/Black ballpoint pen Cell phones, calculators, watch calculators, alarm clocks, digital watches with built-in calculators/memory or any electronic gadgets will not be allowed in the examination hall Occupy the seat allotted to you by verifying the SEAT NUMBER pasted on the desk and indicated in your Admit Card The Test Invigilator will check your Admit Card The Test Booklet will be distributed just before the starting time of the Test. The candidate must ensure that the booklet is sealed. If the seal is found broken or tampered with, please bring this matter to the notice of the invigilator immediately Check immediately that all the pages of the booklet are in order. In the rare event of the Test Booklet being defective, bring it to the notice of the invigilator immediately who will arrange for the replacement of Test Booklet, if required Candidates found using any unfair means will forfeit their chance of being considered for admission and will be debarred from receiving scores Invigilator or Symbiosis Test Secretariat Representative will stamp and authenticate your Admit Card